8 October 2013

Special issue published: "Surfaces and Their Measurement – Part 1"

International Journal of Precision Technology 3(3) 2013
  • Some issues in surface and form metrology
  • Lifting wavelet algorithm for freeform surface filtering using a Gaussian prediction operator
  • Advanced characterisation methodology for engineered surfaces
  • Controllable fabrication of freeform optics
  • Correlation of micro and nano-scale defects with WVTR for aluminium oxide barrier coatings for flexible photovoltaic modules
  • Selection of metrology and manufacturing process for a functional surface

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